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AEAT-7000 - The following cumulative test results Reliability Datasheet

AEAT-7000_9075561.PDF Datasheet


 Full text search : The following cumulative test results Reliability Datasheet


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PART Description Maker
1N974B 1N963B 1N965B 1N962B 1N970B 1N960B 1N968D 1 0.5W, silicon zener diode. Zener voltage 56V. Test current 2.2mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 30V. Test current 4.2mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 62V. Test current 2.0mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 120V. Test current 1.0mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 120V. Test current 1.0mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 75V. Test current 1.7mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 22V. Test current 5.6mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 39V. Test current 3.2mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 68V. Test current 1.8mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 160V. Test current 0.80mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 150V. Test current 0.85mA. -20% tolerance.
0.5W SILICON ZENER DIODES
Low Current Operation at 250??A???Low Reverse Leakage,Low Noise Zener Diode(250??A?・¥?????μ?μ?????°????????????μ?μ?????????a?£°???é???o3?o???????) 50μA低电流操作,低反向漏,低噪声稳压二极管(250μA工作电流,小反向漏电流,低噪声,齐纳二极管)
PC 4/ 5-ST-7,62 .5W硅稳压二极管
Low Current Operation at 250?录A茂录?Low Reverse Leakage,Low Noise Zener Diode(250?录A氓路楼盲陆?莽?碌忙碌?茫??氓掳?氓??氓??忙录?莽?碌忙碌?茫??盲陆?氓?陋氓拢掳茫??茅陆?莽潞鲁盲潞?忙??莽庐隆)
0.5W, silicon zener diode. Zener voltage 180V. Test current 0.68mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 180V. Test current 0.68mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 200V. Test current 0.65mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 150V. Test current 0.85mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 68V. Test current 1.8mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 22V. Test current 5.6mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 7.5V. Test current 16.5mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 130V. Test current 0.95mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 51V. Test current 2.5mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 62V. Test current 2.0mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 56V. Test current 2.2mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 47V. Test current 2.7mA. -10% tolerance.
JGD[Jinan Gude Electronic Device]
济南固锝电子器件有限公司
Jinan Gude Electronic Device Co., Ltd.
Semtech, Corp.
娴???洪??靛??ㄤ欢??????
Jinan Gude Electronic D...
3--21028--2 21028--6 Cumulative Trauma Disorders can result from the prolonged use ofmanually powered hand tools.
TE Connectivity Ltd
525108 Cumulative Trauma Disorders can result from the prolonged use of manually powered hand tools
TE Connectivity Ltd
6249-12-0 6249-24-0 6249-48-0 6249-24-2 6249-12-2 Test Clip To Multi-Stacking Banana Plug Test Lead
Pomona Electronics
6245-48-0 6245-48-2 Test Clip to Straight Sheathed Banana Plug
Connector assemblies, IC clips Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
Pomona Electronics
1-306027-0 1-306027-6 7-59683-4 3-306131-4 2-30583 Cumulative Trauma Disorders can result from the prolonged use of manually powered hand tools.
   Cumulative Trauma Disorders can result from the prolonged use of manually powered hand tools.
TE Connectivity Ltd
408-8378    Cumulative Trauma Disorders can result from the prolonged use ofmanually powered hand tools.
Tyco Electronics
300449 300432 408-7379    Cumulative Trauma Disorders can result from the prolonged use of manually powered hand tools.
TE Connectivity Ltd
5951A Test Probe Set; Connector Type A:Replaceable-Tip Probe (1 Black/1 Red); Connector Type B:Right-Angle Banana Plug; Cable Length:4ft; Current Rating:5A; Features:2 Stainless Steel Sharp Replaceable Probe Tips RoHS Compliant: NA INTERCONNECTION DEVICE
Test Probe Set Replaceable Tip
Pomona Electronics
4000-CU-VDSL-INF 4000-WBTONES 4000-TDR T-BERD?/MTS-4000Multiple Services Test Platform
T-BERD垄莽/MTS-4000Multiple Services Test Platform
JDS Uniphase Corporation
44242-0001 44242-0002 44242-0003 44242-0004 44242- Micro-Fit 3.0垄芒 Test Plugs Won隆炉t Damage Mating Contact
Micro-Fit 3.0 Test Plugs Won’t Damage Mating Contact
Molex Electronics Ltd.
3787-C-18 3787-C-60 5187-K-48 Connector assemblies, IC clips Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
Connector assemblies, IC clips Test; INTERCONNECTION DEVICE
Pomona Electronics
 
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AEAT-7000 电子元器件 AEAT-7000 electric AEAT-7000 positive AEAT-7000 cmos AEAT-7000 Silicon
AEAT-7000 byte AEAT-7000 Collector AEAT-7000 IC DATA SHET AEAT-7000 microprocessor AEAT-7000 Cirkuit diagram
 

 

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